Constant-psi constant-delta contour maps: applications to ellipsometry and to reflection-type optical devices.

Combined reflection and transmission thin-film ellipsometry: a unified linear analysis.

A scheme of combined reflection and transmission ellipsometry on light-transmitting ambient-film-substrate systems is proposed and the required sample design and instrument operation are investigated. A comparative study of the sensitivity of external and internal reflection and transmission ellipsometry is carried out based on unified linear approximations of the exact equations. These approxi...

Ellipsometric function of a film-substrate system: Applications to the design of reflection-type optical devices and to ellipsometry

بررسی ثابت دی الکتریک لایه نازک SiO2با استفاده از آزمون بیضی سنجی

In this paper, we studied the optical behavior of SiO2 thin films prepared via sol-gel route using spin coating deposition from tetraethylorthosilicate (TEOS) as precursor. Thin films were annealed at different temperatures (400-600oC). Absorption edge and band gap of thin layers were measured using UV-Vis spectrophotometery. Optical refractive index and dielectric constant were measured by ell...

Novel Four-Channel All Optical Demultiplexer Based on Square PhCRR for Using WDM Applications

Ring resonators have always been referred to as a highly flexible structurefor designing optical devices. In this study, we have designed and simulation a fourchannel optical demultiplexer using square photonic crystal ring resonator. The squarelattice constant for this purpose structure is used. The purposed structure has an averagecrosstalk, transmission coefficient, q...

Structural, Electrical, and impedance spectroscopy studies of Barium substituted nano calcium ferrites synthesized by solution combustion method.

Barium substituted nanocrystalline ferrites with chemical composition BaxCa1-xFe2O4 (x =0.0 to 0.25) BCAF were prepared by solution combustion method. The phase formation of mixed spinal structured ferrites was confirmed by PXRD analysis. The average crystallite size was calculated using Debye-Scherrer formula and it was found to be in the range of 27-44 nm. Surface morphology was analyzed by S...